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M1 MISTRAL is a compact desktop μ-XRF spectrometer for the analysis of bulk materials and coatings. Its operation is fast, cost-effective, can provide accurate information and materials related to the elemental composition.
Determination of coating thickness and composition such as sample
Zn-Fe, Ag-Cu, Au-Ni-Cu, Sn-Ni-Cu, Cr-Ni-Cu, Au-Pd-Ni-Cu
Jewelry and alloy analysis:
M1 MISTRA jewelry, coins and precious metals ideal analysis tool. All jewelery alloys, platinum group metals and silver products. Less than one minute you can determine its exact composition. The results can be expressed in percentages or K (open).
The instrument with high spatial resolution, spot size down to 100 microns. It can analyze a sample of any shape, such as the most complex jewelry, without further preparation, more importantly, its analysis is lossless. Supported sample sizes up to 100x100x100 cubic millimeter. With cross crosshair video microscope, you can pinpoint the location where you want to measure. Electric Z-sampling station allows for quick focusing. Optional XYZ sampling station may even provide greater comfort.
M1 MISTRAL is equipped with a high-brightness microfocus X-ray tube, ensuring excellent measuring excitation spot, resulting in high fluorescence effects. With powerful, XSpect software suite is easy to use, the instrument can deliver accurate quantitative results, regardless of the analysis of bulk materials or the most complex multi-layer structure.
